ERDAL KARAKUŞ; MÜMIN MEHMET KOÇ*; BURHAN COŞKUN. A Brief Overview for Fundamental Electrical Characterization Techniques for Thin Films and Nanostructures. JOURNAL OF MATERIALS AND ELECTRONIC DEVICES, [S. l.], v. 1, n. 1, 2024. Disponível em: http://dergi-fytronix.com/index.php/jmed/article/view/276. Acesso em: 16 apr. 2026.