ERDAL KAYA; BURHAN COŞKUN*. An Overview for Fundamental Chemical Characterization Techniques for Thin Films and Nanostructures. JOURNAL OF MATERIALS AND ELECTRONIC DEVICES, [S. l.], v. 2, n. 1, p. 33–38, 2023. Disponível em: https://dergi-fytronix.com/index.php/jmed/article/view/266. Acesso em: 18 oct. 2025.