E. B. Dağlı Özkol, S. Eymur, and N. Tuğluoğlu*, “Investigation of diode parameters of Al/Al2O3/n-Si Schottky diode produced by RF sputtering method according to current-voltage and capacitance-voltage characteristics”, J. mater. electron. device., vol. 2, no. 1, pp. 8–13, Dec. 2025.