Structural and morphological characterization of rare earth element doped NiO thin films produced by dynamic sol-gel spin coating method

Abstract

In this study, pure nickel oxide (NiO) and cerium (Ce) doped NiO thin films in different ratios (5 mol.% and 10 mol.%) were coated on the microscope glass by dynamic sol-gel spin coating method. Nickel (II) acetate tetrahydrate was used as a nickel (Ni) source and Cerium (III) nitrate hexahydrate was used as a Ce source. The coating process was carried out in 30 seconds at 2000 rpm and two layers of coating were made. The samples were annealed at 450 °C for 1 hour. The structural properties of the samples were determined by X-ray diffraction analysis (XRD). The morphologies of the coating surfaces were characterized by field emission scanning electron microscopy (FE-SEM) and energy dispersion X-ray spectrometry (EDX). Ce-doped NiO thin films were produced successfully. Lattice parameters and unit cell volume increased with increasing Ce doping. Particles with different morphologies were formed with the doping of Ce. With the Ce doping, rougher surfaces were formed and it increased as the doping ratio increased. The results show that the structural and morphological properties of NiO thin films can be changed with Ce doping. It is thought that the produced Ce-doped NiO thin films can find use area in opto-electronic devices.