Consecutive Imaging and Image Processing Techniques Using Non-Contact Atomic Force Microscopy
Probe Microscopy widely used in the investigation of the surface properties of ultra-thin films, nanostructures, crystal structures etc. Atomic force microscope is an important tool to reveal different properties of such structure since atomic force microscopy is able to provide alternative solutions for desired investigations. Atomic microscopy was mostly used to assess stable and static structures. Especially contact microscopy or tapping microscopy techniques helps researchers to reveal mechanical properties or electrical properties of the thin films and nanostructures since such techniques find opportunity to have intermittent or continuous contact with surface. Such contact obtains valuable data about the mechanical and electrical properties of surface. On contrary, non-contact AFM does not have contact with surface where the forces between AFM tip and surface has important role on surface characterisation. Since AFM tip does not have contact with surface, it was believed that the tip does cause alteration on surface. In this chapter, the consecutive imaging technique used by non-contact AFM will be discussed.